Late-breaking KEYNOTE-B15 data show KEYTRUDA ® (pembrolizumab) plus Padcev ® (enfortumab vedotin-ejfv) significantly improved event-free survival, overall survival and pathologic complete response ...
Abstract: Line edge roughness (LER) is an undesirable phenomenon that arises during semiconductor fabrication processes, causing fluctuations in the characteristics of semiconductor devices and ...
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