Abstract: Functional test sequences are applied to detect defects that escape scan-based tests. The application of a functional test sequence requires a large number of clock cycles. Therefore, test ...
Abstract: Compaction of scan-based test sets is important for reducing the test application time and test data volume. For a circuit with K flip-flops in its longest scan chain, a conventional ...
Soil compaction can devastate yields for years. An upcoming webinar series hosted by the University of Minnesota and NDSU on the subject brings together experts from the U.S., Canada and Australia.
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